
Measure trace impurities before they become a process problem.
The Agilent 5900 ICP-OES is used to measure elemental content in quartz materials. The current analytical workflow covers 13 trace elements—including Fe, Ti, Al and Li—and supports ppm-level impurity evaluation. Reporting limits are confirmed for each element, sample matrix and test method.
- 01Receive & registerRecord sample identity, batch and testing target.
- 02Representative samplingSplit and prepare a representative test portion.
- 03Sample preparationDry, grind or digest according to the selected method.
- 04Trace-element analysisMeasure the agreed impurity elements by ICP-OES.
- 05Review & reportVerify the data and issue a batch-linked result.





